GB/T 11093-1989
Replaced
GB/T 5238-2019
Active
National standards
GB/T 5238-2019 Monocrystalline germanium and monocrystalline germanium slices
GB/T 5238-2019 Monocrystalline germanium and monocrystalline germanium slices
Basic Information
Standard Code:
GB/T 5238-2019
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Element semiconductor materials
ICS Name:
Semiconductor materials
Publish Date:
2019-06-04
Implement Date:
2020-05-01
Pages:
9 pages
Scope
This standard specifies the requirements, test methods, inspection rules, marking, packaging, transportation, storage, quality certificates, and order forms (or contracts) for germanium single crystals and germanium single crystal wafers.
This standard is applicable to germanium single crystals and germanium single crystal wafers used in the preparation of semiconductor devices, laser components, and infrared optical components.
Development Information
Replace the following standards
Referenced Standards
GB/T 2828.1-2012 Sampling procedures for inspection by attributes—Part 1:Sampling schemes indexed by acceptance quality limit(AQL) for lot-by-lot inspection
GB/T 1550-1997 Standard methods for measuring conductivity type of extrinsic semiconducting materials
GB/T 1550-2018 Test methods for conductivity type of extrinsic semiconducting materials
GB/T 1553-1997 Standard test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconductivity decay
GB/T 1553-2009 Test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconductivity decay
GB/T 1553-2023 Test methods for minority carrier lifetime in bulk silicon and germanium—Photoconductivity decay method
GB/T 1555-1997 Test methods for determining the orientation of a semiconductor single crystal
GB/T 1555-2009 Testing methods for determining the orientation of a semiconductor single crystal
GB/T 1555-2023 Test methods for determining the orientation of a semiconductive single crystal
GB/T 5252-1985 Germanium monocrystal—Inspection of dislocation etch pit density
GB/T 5252-2006 Germanium monocrystal—Inspection of dislocation etch pit density
GB/T 5252-2020 Test method for dislocation density of monocrystal germanium
GB/T 14264-1993 Semiconductor materials—Terms and definitions
GB/T 14264-2009 Semiconductor materials—Terms and definitions
GB/T 14264-2024 Terminology of semiconductor materials
GB/T 14844-1993 Designations of semiconductor materials
GB/T 14844-2018 Designations of semiconductor materials
GB/T 26074-2010 Germanium monocrystal—Measurement of resistivity-DC linear four-point probe
Related Standards
GB/T 13388-1992
Replaced
GB/T 13388-1992 Method for measuring crystallographic orientation of flats on single crystal silicon slices and wafers by X-ray techniques
GB/T 13389-1992
Replaced
GB/T 13389-1992 Practice for conversion between resistivity and dopant density for boron-doped and phosphorus-doped silicon
GB/T 13843-1992
Abolished
GB/T 13843-1992 Polished monocrystalline sapphire substrates
GB/T 14015-1992
Active
GB/T 14015-1992 Silicon on sapphire epitaxial wafers
GB/T 14139-1993
Replaced