GB/T 4855-1984
Abolished
T/CIE 198-2023
Active
Group standards
T/CIE 198-2023 Specification for reliability test of flexible semiconductor integrated circuit
T/CIE 198-2023 Specification for reliability test of flexible semiconductor integrated circuit
Price:
$ 38.00
Basic Information
Standard Code:
T/CIE 198-2023
Standard Type:
Group standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Semiconductor integrated circuits
ICS Name:
Integrated circuits, microelectronics
Publish Date:
2023-12-29
Implement Date:
2023-12-29
Pages:
20 pages
Scope
This document specifies the general requirements, test batches, quality assessment, sampling requirements, qualification tests, quality consistency tests, and screening tests for the reliability of flexible semiconductor integrated circuits.
This document is applicable to the evaluation, certification, and assessment of the reliability of flexible semiconductor integrated circuits.
Development Information
Referenced Standards
GB/T 4937.3-2012 Semiconductor devices—Mechanical and climatic tests methods—Part 3:External visual examination
GB/T 4937.4-2012 Semiconductor devices—Mechanical and climatic test methods—Part 4:Damp heat,steady state,highly accelerated stress test(HAST)
GB/T 4937.11-2018 Semiconductor devices—Mechanical and climatic test methods—Part 11:Rapid change of temperature—Two-fluid-bath method
GB/T 4937.14-2018 Semiconductor devices—Mechanical and climatic test methods—Part 14:Robustness of terminations(lead integrity）
GB/T 4937.15-2018 Semiconductor devices—Mechanical and climatic test methods—Part 15:Resistance to soldering temperature for through-hole mounted devices
GB/T 4937.21-2018 Semiconductor devices—Mechanical and climatic test methods—Part 21:Solderability
GB/T 4937.23-2023 Semiconductor devices—Mechanical and climatic test methods—Part 23:High temperature operating life
GB/T 12750-2006 Semiconductor devices—Integrated circuits—Part 11:Sectional specification for semiconductor integrated circuits excluding hybrid circuits
IEC 60749-6
IEC 60749-9
IEC 60749-24
IEC 60749-26
IEC 60749-28
T/CIE 199-2023 Bending test methods of flexible semiconductor integrated circuit
Related Standards
GB/T 3434-1986
Abolished
GB/T 3434-1986 Families and products of ECL circuits for semiconductor integrated circuits
GB/T 3431.2-1986
Active
GB/T 3431.2-1986 Letter symbols for semiconductor integrated circuits—Letter symbols for function of pins
GB/T 6648-1986
Active
GB/T 6648-1986 Blank detail specification for semiconductor integrated circuit static read/write memories
GB/T 6800-1986
Abolished
GB/T 6800-1986 General principles of measuring methods of audio power amplifiers for semicomductor audio integrated circuits
GB/T 3435-1987
Abolished