GB/T 18501.2-2001 Connectors for use in d.c.,low-frequency analogue and digital high speed data applications—Part 2:Circular connectors with assessed quality—Sectional specification

GB/T 18501.1-2001 Connectors with assessed quality, for use in d.c., low frequency analogue and in digital high speed data applications—Part 1:Generic specification

GB/T 18290.2-2000 Solderless connections—Part 2:Solderless crimped connections—General requirements, test methods and practical guidance GB/T 18290.3-2000 Solderless connections—Part 3:Solderless accessible insulation displacement connections—General requirements, test methods and practical guidance GB/T 18290.4-2000 Solderless connections—Part 4:Solderless non-accessible insulation displacement connections—General requirements, test methods and practical guidance GB/T 18290.5-2000 Solderless connections—Part 5:Solderless press-in connections—General requirements, test methods and practical guidance GB/T 18501.1-2001 Connectors with assessed quality, for use in d.c., low frequency analogue and in digital high speed data applications—Part 1:Generic specification IEC 60352-1:1997 GB/T 5095.1-1997 Electromechanical components for electronic equipment Basic testing procedures and measuring methods—Part 1:General GB/T 5095.2-1997 Electromechanical components for electronic equipment Basic testing procedures and measuring methods—Part 2:General examination, electrical continuity and contact resistance tests, insulation tests and voltage stress tests GB/T 5095.3-1997 Electromechanical components for electronic equipment Basic testing procedures and measuring methods —Part 3:Current-carrying capacity tests GB/T 5095.4-1997 Electromechanical components for electronic equipment Basic testing procedures and measuring methods—Part 4:Dynamic stress tests GB/T 5095.5-1997 Electromechanical components for electronic equipment Basic testing procedures and measuring methods—Part 5:Impact tests (free components),static load tests(fixed components),endurance tests and overload tests GB/T 5095.6-1997 Electromechanical components for electronic equipment Basic testing procedures and measuring methods—Part 6:Climatic tests and soldering tests GB/T 5095.7-1997 Electromechanical components for electronic equipment Basic testing procedures and measuring methods—Part 7:Mechanical operating tests and sealing tests GB/T 5095.8-1997 Electromechanical components for electronic equipment Basic testing procedures and measuring methods—Part 8:Connector tests(mechanical) and mechanical tests on contacts and terminations GB/T 5095.9-1997 Electromechanical components for electronic equipment Basic testing procedures and measuring methods—Part 9:Miscellaneous tests GB/T 5095.11-1997 Electromechanical components for electronic equipment Basic testing procedures and measuring methods—Part 11:Climatic tests GB/T 5095.12-1997 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 12:Soldering tests Section 6:Test 12f—Sealing against flux and cleaning solvents in machine soldering GB/T 5095.15-1997 Electromechanical components for electronic equipment Basic testing procedures and measuring methods—Part 15:Mechanical tests on contacts and terminations Section 8:Test 15h—Contact retention system resistance to tool application GB/T 5095.2303-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 23-3:Screening and filtering tests—Test 23c:Shielding effectiveness of connectors and accessories—Line injection method GB/T 5095.2304-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 23-4:Screening and filtering tests—Test 23d:Transmission line reflections in the time domain GB/T 5095.2307-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 23-7:Screening and filtering tests—Test 23g:Effective transfer impedance of connectors GB/T 5095.2501-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 25-1:Test 25a:Crosstalk ratio GB/T 5095.2502-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 25-2:Test 25b:Attenuation (insertion loss) GB/T 5095.2503-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 25-3:Test 25c: Rise time degradation GB/T 5095.2504-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 25-4:Test 25d:Propagation delay GB/T 5095.2505-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 25-5:Test 25e:Return loss GB/T 5095.2506-2020 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 25-6:Test 25f:Eye pattern and jitter GB/T 5095.2507-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 25-7:Test 25g: Impedance, reflection coefficient,and voltage standing wave ratio (VSWR) GB/T 5095.2509-2020 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 25-9:Signal integrity tests—Test 25i:Alien crosstalk

IEC 61076-2:1998 QC 480100