GB/T 4855-1984
Abolished
GB/T 44937.6-2025
Active
National standards
GB/T 44937.6-2025 Integrated circuits—Measurement of electromagnetic emissions—Part 6:Measurement of conducted emissions—Magnetic probe method
GB/T 44937.6-2025 Integrated circuits—Measurement of electromagnetic emissions—Part 6:Measurement of conducted emissions—Magnetic probe method
Price:
$ 81.00
Basic Information
Standard Code:
GB/T 44937.6-2025
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Semiconductor integrated circuits
ICS Name:
Integrated circuits, microelectronics
Publish Date:
2025-12-31
Implement Date:
2026-07-01
Pages:
40 pages
Scope
This document describes a method of evaluating the radio frequency (RF) current of integrated circuit (IC) pins using non-contact current measurement with a miniature magnetic field probe.
This method measures the RF current generated by ICs in the frequency range of 150 kHz to 1 GHz, and is suitable for measuring single or groups of ICs on standard test boards, which can be used to characterize and compare the RF current of ICs. This method is also used to evaluate the electromagnetic characteristics of single or groups of ICs on actual printed circuit boards (PCBs) to reduce emissions. This method is called the "magnetic field probe method".
Development Information
Same series standard
GB/T 44937.1-2025 Integrated circuits—Measurement of electromagnetic emissions—Part 1:General conditions and definitions
GB/T 44937.2-2025 Integrated circuits—Measurement of electromagnetic emissions—Part 2:Measurement of radiated emissions—TEM cell and wideband TEM cell method
GB/T 44937.3-2025 Integrated circuits—Measurement of electromagnetic emissions—Part 3:Measurement of radiated emissions—Surface scan method
GB/T 44937.5-2025 Integrated circuits—Measurement of electromagnetic emissions— Part 5:Measurement of conducted emissions—Workbench Faraday Cage method
GB/T 44937.8-2025 Integrated circuits—Measurement of electromagnetic emissions—Part 8:Measurement of radiated emissions—IC stripline method
Referenced Standards
IEC 61967-1
IEC 61967-4
Adopt standards
IEC 61967-6:2008
Related Standards
GB/T 3434-1986
Abolished
GB/T 3434-1986 Families and products of ECL circuits for semiconductor integrated circuits
GB/T 3431.2-1986
Active
GB/T 3431.2-1986 Letter symbols for semiconductor integrated circuits—Letter symbols for function of pins
GB/T 6648-1986
Active
GB/T 6648-1986 Blank detail specification for semiconductor integrated circuit static read/write memories
GB/T 6800-1986
Abolished
GB/T 6800-1986 General principles of measuring methods of audio power amplifiers for semicomductor audio integrated circuits
GB/T 3435-1987
Abolished