GB/T 46973-2026 Technical specifications for high temperature superconducting thin films of microwave passive devices

GB/T 14140-2009 Test method for measuring diameter of semiconductor wafer GB/T 14140-2025 Test method for measuring diameter of semiconductor wafer GB/T 14140.1-1993 Silicon slices and wafers—Measuring of diameter—Optical projecting method GB/T 14140.2-1993 Silicon slices and wafers—Measuring of diameter—Micrometer method GB/T 17711-1999 The DC electric resistance test method for the critical temperature Tc of a YBa2 Cu3O7-δsuperconducting thin film GB/T 22586-2008 Measurements of surface resistance of high temperature superconductor thin films at microwave frequencies GB/T 22586-2018 Electronic characteristic measurements—Surface resistance of superconductors at microwave frequencies GB/T 28786-2012 Vacuum technology—Methods of bonding strength measurement for vacuum coating film—Measuring adhesion by tape test GB/T 30857-2014 Standard test method for thickness and thickness variation on sapphire substrates GB/T 33826-2017 Measurement of nanofilm thickness on glass substrate —Profilometric method GB/T 36969-2018 Nanotechnology—Method for the measurement of the nanofilm-thickness by atomic force microscopy GB/T 39843-2021 Electronic characteristic measurements—Local critical current density and its distribution in large-area superconducting films