GB/T 46174-2025 Active National standards

GB/T 46174-2025 Space environment—General requirements for space environmental effectsimulation tests of aerospace electronic components

Publish Date: 2025-10-05 Implement Date: 2025-10-05 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

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Basic Information

Standard Code: GB/T 46174-2025

Standard Type: National standards

Standard Status: Active

is_force_gb: no

CCS Name: Electronic components

ICS Name: Integrated aircraft and spacecraft

Publish Date: 2025-10-05

Implement Date: 2025-10-05

Pages: 36 pages

Scope

This document establishes the principles and test procedures for the space environmental effects and ground simulation tests of aerospace electronic components (hereinafter referred to as "components"), and stipulates their test requirements.
This document is applicable to ground simulation tests of aerospace electrical, electronic, electromagnetic, mechanical-electrical, and optoelectronic components for their space environmental effects.

Development Information

Word Count: 57 Thousand words Pages: 36 pages

Referenced Standards

GB/T 4937.2-2006 Semiconductor devices—Mechanical and climatic test methods—Part 2:Low air pressure GB/T 4937.11-2018 Semiconductor devices—Mechanical and climatic test methods—Part 11:Rapid change of temperature—Two-fluid-bath method GB/T 4937.18-2018 Semiconductor devices—Mechanical and climatic test methods—Part 18:Ionizing radiation(total dose) GB/T 32452-2015 Terminology of space environment for spacecraft GB/T 32452-2025 Space terminology—Space environment GB/T 34517-2017 Evaluating method for spacecraft nonmetal materials outgassing in vacuum GB/T 39343-2020 Processor device single event effects experiment design and procedure for aerospace GB/T 41543-2022 Space environment—General principles and criteria of space environmental effect simulation test for space materials GB/T 42969-2023 Displacement damage test method for components GB/T 43967-2024 Space environment—Test method of single event effects induced by pulsed laser of semiconductor devices for space application GB/T 44181-2024 Space environment—Method of single event upset rates prediction of semiconduct-or devices for space applications ISO 21494 IEC 60749.25 JEDEC JESD22-A114E

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