YS/T 989-2014 Active Industry standards-Non-ferrous metals

YS/T 989-2014 Germanium grain

YS/T 989-2014 Germanium grain

Publish Date: 2014-10-14 Implement Date: 2015-04-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: YS/T 989-2014

Standard Type: Industry standards

Standard Status: Active

is_force_gb: no

CCS Name: Element semiconductor materials

ICS Name: Semiconductor materials

Publish Date: 2014-10-14

Implement Date: 2015-04-01

Pages: 5 pages

Scope

This standard specifies the requirements, inspection methods, inspection rules, and marking, packaging, transportation, storage, quality certificates, and order forms (or contracts) for germanium particles.
This standard applies to germanium particles made from germanium single crystals or zone-melted germanium ingots through mechanical processing, primarily used as inserts for crafts and fitness protective gear.

Development Information

Word Count: 9 Thousand words Pages: 5 pages

Referenced Standards

GB/T 2828.1-2003 Sampling procedures for inspection by attributes—Part 1:Sampling schemes indexed by acceptance quality limit(AQL) for lot-by-lot inspection GB/T 2828.1-2012 Sampling procedures for inspection by attributes—Part 1:Sampling schemes indexed by acceptance quality limit(AQL) for lot-by-lot inspection GB/T 5238-1995 Monocrystalline germanium GB/T 5238-2009 Monocrystalline germanium and monocrystalline germanium slices GB/T 5238-2019 Monocrystalline germanium and monocrystalline germanium slices GB/T 11071-1989 Zone-refined germanium ingot GB/T 11071-2006 Zone-refined germanium ingot GB/T 11071-2018 Zone-refined germanium ingot

Related Standards

GB/T 11093-1989 Replaced

GB/T 11093-1989 Liquid encapsulated czochralski-grown gallium arsenide single crystals and As-cut slices

Publish Date: 1989-03-31

GB/T 13388-1992 Replaced

GB/T 13388-1992 Method for measuring crystallographic orientation of flats on single crystal silicon slices and wafers by X-ray techniques

Publish Date: 1992-02-19

GB/T 13389-1992 Replaced

GB/T 13389-1992 Practice for conversion between resistivity and dopant density for boron-doped and phosphorus-doped silicon

Publish Date: 1992-02-19

GB/T 13843-1992 Abolished

GB/T 13843-1992 Polished monocrystalline sapphire substrates

Publish Date: 1992-12-28

GB/T 14015-1992 Active

GB/T 14015-1992 Silicon on sapphire epitaxial wafers

Publish Date: 1992-12-28

GB/T 14139-1993 Replaced

GB/T 14139-1993 Silicon epitaxial wafers

Publish Date: 1993-02-06