GB/T 42191-2023 Test methods of the performances for MEMS piezoresistive pressure-sensitive device

GB/T 2423.1-2008 Environmental testing for electric and electronic products—Part 2:Test methods—Tests A:Cold GB/T 2423.2-2008 Environmental testing for electric and electronic products—Part 2:Test methods—Tests B:Dry heat GB/T 2423.5-1995 Environmental testing for electric and electronic products—Part 2:Test methods—Test Ea and guidance:Shock GB/T 2423.5-2019 Environmental testing—Part 2:Test methods—Test Ea and guidance:Shock GB/T 2423.22-2002 Environmental testing for electric and electronic products—Part 2:Test methods Test N:Change of temperature GB/T 2423.22-2012 Environmental testing—Part 2:Test methods—Test N:Change of temperature GB/T 4937.12-2018 Semiconductor devices—Mechanical and climatic test methods—Part 12:Vibration,variable frequency GB/T 26111-2010 Micro-electromechanical system technology—Terms GB/T 26111-2023 Micro-electromechanical system technology—Terms GB/T 33922-2017 Wafer level test methods for MEMS piezoresistive pressure-sensitive die performances