GB/T 31092-2022 Active National standards

GB/T 31092-2022 Monocrystalline sapphire bar

GB/T 31092-2022 Monocrystalline sapphire bar

Publish Date: 2022-12-30 Implement Date: 2023-07-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 31092-2022

Standard Type: National standards

Standard Status: Active

is_force_gb: no

CCS Name: Compound semiconductor materials

ICS Name: Semiconductor materials

Publish Date: 2022-12-30

Implement Date: 2023-07-01

Pages: 10 pages

Scope

This document specifies the technical requirements, test methods, inspection rules, marking, packaging, transportation, storage, accompanying documents, and order form content for sapphire single-crystal rods. This document is applicable to sapphire single-crystal rods (hereinafter referred to as "rods") used for substrates and optical purposes.

Development Information

Word Count: 22 Thousand words Pages: 10 pages

Replace the following standards

GB/T 31092-2014 Monocrystalline sapphire ingot

Referenced Standards

GB/T 1958-2004 Geometrical product Specifications(GPS)—Geometrical tolerance—Verification prescription GB/T 1958-2017 Geometrical Product Specifications(GPS)—Geometrical tolerance—Verification GB/T 7962.12-1987 Colorless optical glass test methods Spectral internal transmittance GB/T 7962.12-2010 Test methods of colourless optical glass—Part 12:Spectral internal transmittance GB/T 14264-1993 Semiconductor materials—Terms and definitions GB/T 14264-2009 Semiconductor materials—Terms and definitions GB/T 14264-2024 Terminology of semiconductor materials GB/T 31093-2014 Test method for stress of monocrystalline sapphire ingot GB/T 33236-2016 Polycrystalline silicon—Determination of trace elements—Glow discharge mass spectrometry method GB/T 33763-2017 Test method for dislocation density of sapphire single crystal GB/T 34210-2017 Test method for determining the orientation of sapphire single crystal GB/T 34612-2017 Measurement method for X-ray double crystal diffraction rocking curve of sapphire crystals

Related Standards

GB/T 11093-1989 Replaced

GB/T 11093-1989 Liquid encapsulated czochralski-grown gallium arsenide single crystals and As-cut slices

Publish Date: 1989-03-31

GB/T 13388-1992 Replaced

GB/T 13388-1992 Method for measuring crystallographic orientation of flats on single crystal silicon slices and wafers by X-ray techniques

Publish Date: 1992-02-19

GB/T 13389-1992 Replaced

GB/T 13389-1992 Practice for conversion between resistivity and dopant density for boron-doped and phosphorus-doped silicon

Publish Date: 1992-02-19

GB/T 13843-1992 Abolished

GB/T 13843-1992 Polished monocrystalline sapphire substrates

Publish Date: 1992-12-28

GB/T 14015-1992 Active

GB/T 14015-1992 Silicon on sapphire epitaxial wafers

Publish Date: 1992-12-28

GB/T 14139-1993 Replaced

GB/T 14139-1993 Silicon epitaxial wafers

Publish Date: 1993-02-06