GB/T 4855-1984
Abolished
GB/T 46894-2025
Active
National standards
GB/T 46894-2025 EMC test generic specification of vehicle IC
GB/T 46894-2025 EMC test generic specification of vehicle IC
Price:
$ 56.00
Basic Information
Standard Code:
GB/T 46894-2025
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Semiconductor integrated circuits
ICS Name:
Integrated circuits, microelectronics
Publish Date:
2025-12-31
Implement Date:
2026-07-01
Pages:
28 pages
Scope
This document specifies the general test requirements for the electromagnetic compatibility (EMC) of vehicle integrated circuits (ICs), and describes the corresponding test methods.
This document applies to the radio frequency (RF) emission and RF immunity of vehicle ICs in the frequency range of 150 kHz to 6 GHz, as well as pulse immunity and system-level electrostatic discharge (ESD) immunity.
This document is a general specification. The test items and test levels for specific ICs refer to the corresponding product standards, or are determined through consultation between IC users and manufacturers.
Development Information
Referenced Standards
GB/T 19951-2019 Road vehicles—Disturbances test methods for electrical/electronic component from electrostatic discharge
GB/T 42968.1-2023 Integrated circuits—Measurement of electromagnetic immunity—Part 1:General conditions and definitions
GB/T 42968.2-2024 Integrated circuits—Measurement of electromagnetic immunity—Part 2:Measurement of radiated immunity—TEM cell and wideband TEM cell method
GB/T 42968.4-2024 Integrated circuits—Measurement of electromagnetic immunity—Part 4:Direct RF power injection method
GB/T 42968.8-2023 Integrated circuits—Measurement of electromagnetic immunity—Part 8:Measurement of radiated immunity—IC stripline method
GB/T 43034.3-2023 Integrated circuits—Measurement of impulse immunity—Part 3:Non-synchronous transient injection method
GB/T 44937.1-2025 Integrated circuits—Measurement of electromagnetic emissions—Part 1:General conditions and definitions
GB/T 44937.2-2025 Integrated circuits—Measurement of electromagnetic emissions—Part 2:Measurement of radiated emissions—TEM cell and wideband TEM cell method
GB/T 44937.4-2024 Integrated circuits—Measurement of electromagnetic emissions—Part 4:Measurement of conducted emissions—1 Ω/150 Ω direct coupling method
GB/T 44937.8-2025 Integrated circuits—Measurement of electromagnetic emissions—Part 8:Measurement of radiated emissions—IC stripline method
Related Standards
GB/T 3434-1986
Abolished
GB/T 3434-1986 Families and products of ECL circuits for semiconductor integrated circuits
GB/T 3431.2-1986
Active
GB/T 3431.2-1986 Letter symbols for semiconductor integrated circuits—Letter symbols for function of pins
GB/T 6648-1986
Active
GB/T 6648-1986 Blank detail specification for semiconductor integrated circuit static read/write memories
GB/T 6800-1986
Abolished
GB/T 6800-1986 General principles of measuring methods of audio power amplifiers for semicomductor audio integrated circuits
GB/T 3435-1987
Abolished