SJ 21441-2018 Active Industry standards-Electronics

SJ 21441-2018 Specification for high purity semi-insulating silicon carbide monocrystalline wafers of SiC-HPSI

Publish Date: 2018-01-18 Implement Date: 2018-05-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Price: $ 30

Basic Information

Standard Code: SJ 21441-2018

Standard Type: Industry standards

Standard Status: Active

is_force_gb: no

CCS Name: -

ICS Name: -

Publish Date: 2018-01-18

Implement Date: 2018-05-01

Pages: 24 pages

Scope

This specification stipulates the technical requirements, quality assurance provisions, and delivery preparations for SiC-HPSI high-purity semi-insulating silicon carbide single crystals. This specification applies to SiC-HPSI high-purity semi-insulating silicon carbide single crystals (hereinafter referred to as silicon carbide single crystals).

Development Information

Pages: 24 pages

Referenced Standards

GB/T 13387-1992 Test method for measuring flat length on slices of electronic materials GB/T 13387-2009 Test method for measuring flat length wafers of silicon and other electronic materials GB/T 1555-1997 Test methods for determining the orientation of a semiconductor single crystal GB/T 1555-2009 Testing methods for determining the orientation of a semiconductor single crystal GB/T 1555-2023 Test methods for determining the orientation of a semiconductive single crystal GB/T 191-2000 Packaging—Pictorial marking for handling of goods GB/T 191-2008 Packaging—Pictorial marking for handling of goods GB/T 30656-2014 Polished monocrystalline silicon carbide wafers GB/T 30866-2014 Test method for measuring diameter of monocrystalline silicon carbide wafers GB/T 30867-2014 Test method for measuring thickness and total thickness variation of monocrystalline silicon carbide wafers GB/T 32189-2015 Test method for surface roughness of GaN single crystal substrate by atomic force microscope GB/T 32278-2015 Test method for flatness of monocrystalline silicon carbide wafers GB/T 6624-1995 Standard method for measuring the surface quality of polished silicon slices by visual inspection GB/T 6624-2009 Standard method for measuring the surface quality of polished silicon slices by visual inspection GJB 179A-1996 GB/T 191-2025 Graphical symbols marking for handling and storage of packages

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