GB/T 11072-2009 Active National standards

GB/T 11072-2009 Indium antimonide polycrystal,single crystals and as-cut slices

GB/T 11072-2009 Indium antimonide polycrystal,single crystals and as-cut slices

Publish Date: 2009-10-30 Implement Date: 2010-06-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 11072-2009

Standard Type: National standards

Standard Status: Active

is_force_gb: no

CCS Name: Compound semiconductor materials

ICS Name: Semiconductor materials

Publish Date: 2009-10-30

Implement Date: 2010-06-01

Pages: 7 pages

Scope

1.1 This standard specifies the product classification, technical requirements, and testing methods for indium antimonide polycrystals, single crystals, and single crystal slices. 1.2 This standard applies to indium antimonide polycrystals prepared by the zone melting method and indium antimonide polycrystals, single crystals, and slices prepared by the direct pulling method for use in the production of infrared detectors and magnetically sensitive components, etc.

Development Information

Word Count: 10 Thousand words Pages: 7 pages

Replace the following standards

GB/T 11072-1989 Indium antimonide polycrystal, single crystals and as-cut slices

Referenced Standards

GB/T 8759 GB/T 4326-1984 Extrinsic semiconductor single crystals—measurement of Hall mobility and Hall coefficient GB/T 4326-2006 Extrinsic semiconductor single crystals measurement of Hall mobility and Hall coefficient GB/T 11297.1-2002 Test method for wavefront distortion of laser rods GB/T 11297.1-2017 Test method for wavefront distortion of laser rods GB/T 11297.3-2002 Test method for extinction ratio of Nd:YAG laser rods GB/T 11297.8-2015 Test method for pyroelectric coefficient of pyroelectric materials GB/T 11297.9-2015 Test method for dielectric tangent of loss angle of pyroelectric materials GB/T 11297.10-2015 Test method for curie temperature of pyroelectric materials GB/T 11297.11-2015 Test method for dielectric constant of pyroelectric materials GB/T 11297.12-2012 Test method for extinction ratio of optical crystal GB/T 11297.4-1989 Test method fornormal pulse lasing threshold and slope efficiency of Nd:YAG laser rods GB/T 11297.5-1989 Test method for continuous lasing threshold， slope efficiency and output power of Nd∶YAG laser rods GB/T 11297.12-1989 Test method forextinction ratio of LN， KDP and KDP electrooptic crystal GB/T 4326-2025 Extrinsic semiconductor single crystals measurement of Hall mobility and Hall coefficient

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