DB31/ 792-2020 Active Shanghai CityLocal standards

DB31/ 792-2020 The energy consumption limit for single crystal silicon and its wafers as products

DB31/ 792-2020 The energy consumption limit for single crystal silicon and its wafers as products

Publish Date: 2020-03-05 Implement Date: 2020-06-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

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Basic Information

Standard Code: DB31/ 792-2020

Standard Type: Local standards

Standard Status: Active

is_force_gb: no

CCS Name: Technical management

ICS Name: Integrated Energy and Heat Transfer Engineering

Publish Date: 2020-03-05

Implement Date: 2020-06-01

Pages: 12 pages

Scope

This standard specifies the technical requirements, statistical scope, calculation methods, and guidance for energy conservation and reduction for silicon single crystals and silicon single crystal wafers.
This standard applies to semiconductor-grade silicon single crystals and silicon single crystal wafers, including grinding wafers, polished wafers, and epitaxial wafers (hereinafter collectively referred to as "silicon wafers"). It is applicable to the calculation and assessment of the single energy consumption of products of silicon wafer manufacturers, as well as the control of the single energy consumption of new projects.

Development Information

Word Count: 14 Thousand words Pages: 12 pages

Replace the following standards

DB31/ 792-2014 The energy consumption limit for individual products of silicon single crystal and its wafers

Referenced Standards

GB/T 2589-1990 General principles for calculation of total production energy consumption GB/T 2589-2008 General principles for calculation of the comprehensive energy consumption GB/T 2589-2020 General rules for calculation of the comprehensive energy consumption GB/T 12962-1996 Monocrystalline silicon GB/T 12962-2005 Monoccrystalline silicon GB/T 12962-2015 Monocrystalline silicon GB/T 12964-2003 Monocrystalline silicon polished wafers GB/T 12964-2018 Monocrystalline silicon polished wafers GB/T 12965-1996 Monocrystalline silicon as cut slices and lapped slices GB/T 12965-2005 Monocrystalline silicon as cut slices and lapped slices GB/T 12965-2018 Monocrystalline silicon as cut wafers and lapped wafers GB/T 14139-1993 Silicon epitaxial wafers GB/T 14139-2009 Silicon epitaxial wafers GB/T 14139-2019 Silicon epitaxial wafers GB/T 17167-1997 Guides for providing and managing of the measuring instruments of energy in enterprise GB 17167-2006 General principle for equipping and managing of the measuring instrument of energy in organization of energy using GB 17167-2025 General rules for energy measuring instrument equipping and managing of energy user

Related Standards

GB/T 3794-1983 Abolished

GB/T 3794-1983 Standard for assesment of technical proficiency and acceptahce for energy balance of industrial enterprise

Publish Date: 1983-07-06

GB/T 5623-1985 Replaced

GB/T 5623-1985 Guides for the stipulation and administration of electricity consumption norm of product

Publish Date: 1985-11-25

GB/T 6421-1986 Abolished

GB/T 6421-1986 Methods for drawing energy flow diagram of industrial enterprise

Publish Date: 1986-05-27

GB/T 6422-1986 Replaced

GB/T 6422-1986 Directives for measuring and testing energy consumption in industrial enterprises

Publish Date: 1986-05-27

GB/T 6425-1986 Replaced

GB/T 6425-1986 Nomenclature for thermal analysis

Publish Date: 1986-05-27

GB/T 8174-1987 Replaced

GB/T 8174-1987 Methods of measuring and evaluating thermal insulation effects for equipments and pipes

Publish Date: 1987-08-28