GB/T 45968-2025 Optical near stoichiometric lithium niobate crystal used in quantum information

GB/T 191-2000 Packaging—Pictorial marking for handling of goods GB/T 191-2008 Packaging—Pictorial marking for handling of goods GB/T 1185-2006 Surface imperfections of optical elements GB/T 1216-1985 Micrometers GB/T 1216-2004 external micrometer GB/T 1216-2018 External micrometer GB/T 2828.1-2012 Sampling procedures for inspection by attributes—Part 1:Sampling schemes indexed by acceptance quality limit(AQL) for lot-by-lot inspection GB/T 3389-2008 Test methods for the properties of piezoelectric ceramics—Test for the performance parameter GB/T 3389.1-1996 Vocabulary for ferroelectric and piezoelectric ceramics GB/T 3389.2-1999 Test methods for the properties of piezoelectric ceramics——Static test for piezoelectric strain constant d33 GB/T 3389.3-2001 Test methods for the properties of piezoelectric ceramics—Test for Curie temperature Tc GB/T 3389.4-1982 Test methods for the properties of piezoelectric ceramics—Longitudinal length extension vibration mode for rod GB/T 3389.5-1995 Test methods for the properties of piezoelectric ceramics—Thickness extension vibration mode for disk GB/T 3389.6-1997 Test methods for properties of piezoelectric ceramics Thickness-shear vibration mode for rectangular plate GB/T 3389.7-1986 Test methods for the properties of piezoelectric ceramics Test for dielectric properties in high electric field GB/T 3389.8-1986 Test methods for the properties of piezoelectric ceramics Test for the pyroelectric coefficient GB/T 6426-1999 Quasi-static test method for ferroelectric hysteresis loop in ferroelectric ceramics GB/T 6618-1995 Test method for thickness and total thickness variation of silicon slices GB/T 6618-2009 Test method for thickness and total thickness variation of silicon slices GB/T 6619-1995 Test methods for bow of silicon slices GB/T 6619-2009 Test methods for bow of silicon wafers GB/T 6620-1995 Test method for measuring warp on silicon slices by noncontact scanning GB/T 6620-2009 Test method for measuring warp on silicon slices by noncontact scanning GB/T 7962.2-1987 Colorless optical glass test methods Test method by collimator for optical homogeneity GB/T 7962.2-2010 Test methods of colourless optical glass—Part 2:Optical homogeneity—Fizeau plano-interferometry GB/T 11297.12-2012 Test method for extinction ratio of optical crystal GB/T 11297.12-1989 Test method forextinction ratio of LN， KDP and KDP electrooptic crystal GB/T 20919-2007 External micrometer with electronic digital display GB/T 20919-2018 External micrometer with electronic digital display GB/T 22453-2008 Non-linear optical borate crystal devices measuring method GB/T 22453-2025 Non-linear optical crystal devices measuring method for laser GB/T 30857-2014 Standard test method for thickness and thickness variation on sapphire substrates GB/T 30866-2014 Test method for measuring diameter of monocrystalline silicon carbide wafers GB/T 31227-2014 Test method for the surface roughness by atomic force microscope for sputtered thin films GB/T 34210-2017 Test method for determining the orientation of sapphire single crystal JB/T 9495.3-1999 Measuring method for transmittance of optical crystal GB/T 191-2025 Graphical symbols marking for handling and storage of packages GB/T 6426-2025 Quasi-static test method for ferroelectric hysteresis loop in ferroelectric ceramics