GB/T 11093-1989
Replaced
GB/T 29055-2019
Active
National standards
GB/T 29055-2019 Multicrystalline silicon wafers for photovoltaic solar cell
GB/T 29055-2019 Multicrystalline silicon wafers for photovoltaic solar cell
Price:
$ 50
Basic Information
Standard Code:
GB/T 29055-2019
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Element semiconductor materials
ICS Name:
Semiconductor materials
Publish Date:
2019-06-04
Implement Date:
2020-05-01
Pages:
7 pages
Scope
This standard specifies the requirements, test methods, inspection rules, marking, packaging, transportation, storage, quality certificates, and order forms (or contracts) for polycrystalline silicon wafers used in solar cells (hereinafter referred to as "silicon wafers").
This standard applies to cast polycrystalline silicon wafers used in solar cells (including quasi-monocrystalline silicon wafers).
Development Information
Replace the following standards
Referenced Standards
GB/T 2828.1-2012 Sampling procedures for inspection by attributes—Part 1:Sampling schemes indexed by acceptance quality limit(AQL) for lot-by-lot inspection
GB/T 1550-1997 Standard methods for measuring conductivity type of extrinsic semiconducting materials
GB/T 1550-2018 Test methods for conductivity type of extrinsic semiconducting materials
GB/T 6616-1995 Test method for measuring resistivity of semiconductor silicon or sheet resistance of semiconductor films with a noncontact eddy-current gage
GB/T 6616-2009 Test methods for measuring resistivity of semiconductor wafers or sheet resistance of semiconductor films with a noncontact eddy-current gauge
GB/T 6616-2023 Test method for resistivity of semiconductor wafers and sheet resistance of semiconductor films—Noncontact eddy-current gauge
GB/T 6618-1995 Test method for thickness and total thickness variation of silicon slices
GB/T 6618-2009 Test method for thickness and total thickness variation of silicon slices
GB/T 6619-1995 Test methods for bow of silicon slices
GB/T 6619-2009 Test methods for bow of silicon wafers
GB/T 14264-1993 Semiconductor materials—Terms and definitions
GB/T 14264-2009 Semiconductor materials—Terms and definitions
GB/T 14264-2024 Terminology of semiconductor materials
GB/T 29054-2012 Solar-grade casting multi-crystalline silicon brick
GB/T 29054-2019 Casting multicrystalline silicon brick for photovoltaic solar cell
GB/T 30860-2014 Test methods for surface roughness and saw mark of silicon wafers for solar cells
GB/T 30869-2014 Test method for thickness and total thickness variation of silicon wafers for solar cell
YS/T 28-1992 Silicon wafer packaging
YS/T 28-2015 Package of silicon wafers
SJ/T 11627-2016 The online testing method for the resistivity of silicon wafers used in solar cells
SJ/T 11628-2016 The online testing methods for silicon wafer size and electrical characterization for solar cells
SJ/T 11630-2016 SJ/T 11630-2016 Geometric Dimension Test Method for Silicon Substrates Used in Solar Cells
SJ/T 11631-2016 The testing method for surface defects of silicon wafers used in solar cells
SJ/T 11632-2016 Testing method for micro-crack defects in silicon wafers used in solar cells
YS/T 28-2024 YS/T 28-2024 Silicon wafer packaging and labeling
Related Standards
GB/T 13388-1992
Replaced
GB/T 13388-1992 Method for measuring crystallographic orientation of flats on single crystal silicon slices and wafers by X-ray techniques
GB/T 13389-1992
Replaced
GB/T 13389-1992 Practice for conversion between resistivity and dopant density for boron-doped and phosphorus-doped silicon
GB/T 13843-1992
Abolished
GB/T 13843-1992 Polished monocrystalline sapphire substrates
GB/T 14015-1992
Active
GB/T 14015-1992 Silicon on sapphire epitaxial wafers
GB/T 14139-1993
Replaced